DocumentCode :
1231281
Title :
Testing a 4-b shift register at 11 GHz
Author :
Yuh, P.-F.
Author_Institution :
Hypres Inc., Elmsford, NY, USA
Volume :
2
Issue :
2
fYear :
1992
fDate :
6/1/1992 12:00:00 AM
Firstpage :
101
Lastpage :
105
Abstract :
A 4-bit superconducting shift register based on edge triggered gates has been tested up to 11 GHz with two-phase offset sinewave clocks. The edge triggered gates are made by serial connection of a Josephson junction (JJ) and a modified variable threshold gate, fabricated by a Nb/AlO/sub x//Nb process.<>
Keywords :
aluminium compounds; integrated circuit testing; logic testing; niobium; shift registers; superconducting logic circuits; 11 GHz; 4 bit; Josephson junction; MVTL; Nb-AlO/sub x/-Nb; edge triggered gates; modified variable threshold gate; serial connection; sinewave clocks; superconducting shift register; two phase clock; Clocks; Critical current; Electronics packaging; Josephson junctions; Logic gates; Niobium; Resistors; Shift registers; Switches; Testing;
fLanguage :
English
Journal_Title :
Applied Superconductivity, IEEE Transactions on
Publisher :
ieee
ISSN :
1051-8223
Type :
jour
DOI :
10.1109/77.139226
Filename :
139226
Link To Document :
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