DocumentCode :
1231388
Title :
Multiscale corner detection by using wavelet transform
Author :
Lee, Jiann-Shu ; Sun, Yung-Nien ; Chen, Chin-Hsing
Author_Institution :
Dept. of Electr. Eng., Nat. Cheng Kung Univ., Tainan, Taiwan
Volume :
4
Issue :
1
fYear :
1995
fDate :
1/1/1995 12:00:00 AM
Firstpage :
100
Lastpage :
104
Abstract :
A multiscale corner detection algorithm based on the wavelet transform of contour orientation is proposed. It can utilize both the information of the local extrema and modulus of transform results to detect corners and arcs effectively. The ramp-width of contour orientation profile, which can be computed using the transformed modulus of two scales, reveals the difference between corner and arc and is utilized in the determination of corner points. The experimental results have shown that the detector is more effective than both the single- and multiple-scale detectors. They also demonstrate that the detector is insensitive to boundary noise. In addition, the proposed method is more efficient than the other multiscale corner detector because it operates on fewer number of scales, which can be implemented by a fast transform algorithm
Keywords :
edge detection; wavelet transforms; arcs; boundary noise; contour orientation; fast transform algorithm; local extrema; modulus; multiscale corner detection; ramp-width; transform results; wavelet transform; Continuous wavelet transforms; Convolution; Detectors; Smoothing methods; Spline; Wavelet transforms;
fLanguage :
English
Journal_Title :
Image Processing, IEEE Transactions on
Publisher :
ieee
ISSN :
1057-7149
Type :
jour
DOI :
10.1109/83.350810
Filename :
350810
Link To Document :
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