Title :
SOI technology for future high-performance smart cards
Author :
Neve, A. ; Flandre, Denis ; Quisquater, J.-J.
Author_Institution :
Univ. Catholique de Louvain, Belgium
Abstract :
Chips based on silicon-on-insulator (SOI) technology meet the tough performance and security requirements presented by smart cards. A test chip manufactured in a fully depleted SOI process incorporates a charge pump and random-number generator, critical smart-card circuit blocks.
Keywords :
CMOS integrated circuits; random number generation; silicon-on-insulator; smart cards; CMOS; VLSI; random-number generators; silicon-on-insulator; smart cards; subscriber identification module; CMOS technology; Central Processing Unit; Circuits; Cryptography; MOSFETs; Security; Silicon on insulator technology; Smart cards; Very large scale integration; Voltage;
Journal_Title :
Micro, IEEE
DOI :
10.1109/MM.2003.1209467
