DocumentCode :
123150
Title :
Timing margin recovery with flexible flip-flop timing model
Author :
Kanng, Andrew B. ; Hyein Lee
Author_Institution :
ECE Depts., Univ. of California at San Diego, La Jolla, CA, USA
fYear :
2014
fDate :
3-5 March 2014
Firstpage :
496
Lastpage :
503
Abstract :
In timing signoff for leading-edge SOCs, even few-picosecond timing violations will not only increase design turnaround time, but also degrade design quality (e.g., through power increase from insertion of extra buffers). Conventional flip-flop timing models have fixed values of setup/hold times and clock-to-q (c2q) delay, with some advanced “setup-hold pessimism reduction” (SHPR) methodologies exploiting multiple setup-hold pairs in the timing model. In this work, we propose to use multiple timing models to give more flexibility at timing path boundaries, thus recovering significant “free” margins and reducing the number of timing violations that require unnecessary fixes. We exploit a flexible flip-flop timing model that captures the three-way tradeoff among setup time, hold time and c2q delay, so as to reduce pessimism in timing analysis of setup- or hold-critical paths. A sequential linear programming optimization for multiple corners is used to selectively analyze setup- or hold-critical paths with less pessimism. Further improvements are possible based on partitioning of timing paths according to different modes. We demonstrate that our method can improve worst setup/hold slack metrics over conventional signoff methods, using a set of open-source designs implemented in a 65nm foundry library. We show that opportunity for timing pessimism reduction with our approach remains significant in a 28nm FDSOI foundry library as well.
Keywords :
elemental semiconductors; flip-flops; linear programming; silicon-on-insulator; system-on-chip; timing; FDSOI foundry library; SHPR methodology; Si; c2q delay; clock-to-q delay; design quality; design turnaround time; flexible flip-flop timing model; hold-critical path; leading-edge SOC; open-source designs; sequential linear programming optimization; setup-critical path; setup-hold pessimism reduction methodology; setup-hold slack metrics; setup-hold times; size 28 nm; size 65 nm; timing analysis; timing margin recovery; timing path boundary; timing path partitioning; timing pessimism reduction; timing signoff; timing violation number; Analytical models; Clocks; Delays; Foundries; Libraries; Optimization;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Quality Electronic Design (ISQED), 2014 15th International Symposium on
Conference_Location :
Santa Clara, CA
Print_ISBN :
978-1-4799-3945-9
Type :
conf
DOI :
10.1109/ISQED.2014.6783367
Filename :
6783367
Link To Document :
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