DocumentCode :
1231541
Title :
Simplified Birthday Statistics and Hamming EDAC
Author :
Tausch, Hans J.
Author_Institution :
T2 Res., Albuquerque, NM
Volume :
56
Issue :
2
fYear :
2009
fDate :
4/1/2009 12:00:00 AM
Firstpage :
474
Lastpage :
478
Abstract :
Space systems use error detection and correction (EDAC) schemes to protect memory contents from single event upsets (SEUs). Hamming EDAC is the preferred scheme for fast, random access memories. It allows for the correction of a single bit error within a word and the detection of a double bit error. The common assumption is that the likelihood of an uncorrectable double bit error is very small. This paper develops a simple equation that predicts the cumulative probability of a double bit error occurring within some word of Hamming protected memory as the number of random upsets increase and shows how it can be used to better understand the protection provided by EDAC.
Keywords :
Hamming codes; error correction; error detection; probability; random processes; statistical analysis; Hamming EDAC; birthday statistics; bit error; cumulative probability; error correction; error detection; random access memories; Equations; Error correction; Error correction codes; Event detection; Protection; Radiation effects; Random access memory; Single event transient; Single event upset; Statistics; Error correction; Hamming codes; error detection coding; integrated circuit radiation effects; memory architecture; memory fault tolerance; radiation effects;
fLanguage :
English
Journal_Title :
Nuclear Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9499
Type :
jour
DOI :
10.1109/TNS.2009.2012710
Filename :
4812293
Link To Document :
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