DocumentCode :
1231558
Title :
Development of Radiation Hard {\\rm N}^{+} -on-P Silicon Microstrip Sensors for Super LHC
Author :
Hara, Kazuhiko ; Inoue, Koki ; Mochizuki, Ai ; Meguro, Tatsuma ; Hatano, Hiromitsu ; Ikegami, Yoichi ; Kohriki, Takashi ; Terada, Susumu ; Unno, Yoshinobu ; Yamamura, Kazuhisa ; Kamata, Shintaro
Author_Institution :
Inst. of Pure & Appl. Sci., Univ. of Tsukuba, Tsukuba
Volume :
56
Issue :
2
fYear :
2009
fDate :
4/1/2009 12:00:00 AM
Firstpage :
468
Lastpage :
473
Abstract :
Radiation tolerance up to 1015 1-MeV neq/cm2 is required for the silicon microstrip sensors to be operated at the Super LHC experiment. As a candidate for such sensors, we are investigating non-inverting n+-on-p sensors. We manufactured sample sensors of 1 times 1 cm in 4" and 6" processes with implementing different interstrip electrical isolation structures. Industrial high resistive p-type wafers from FZ and MCZ growth are tested. They are different in crystal orientations lang100rang and lang111rang with different wafer resistivities. The sensors were irradiated with 70-MeV protons and characterized in views of the leakage current increase, noise figures, electrical strip isolation, full depletion voltage evolution, and charge collection efficiency.
Keywords :
electrical resistivity; position sensitive particle detectors; proton effects; silicon radiation detectors; FZ growth; MCZ growth; Super LHC; charge collection efficiency; depletion voltage evolution; electron volt energy 70 MeV; high-resistive p-type wafers; interstrip electrical isolation structures; leakage current; position sensitive particle detector; protons; radiation hard n+-on-p silicon microstrip sensors; size 1 cm; Conductivity; Large Hadron Collider; Leakage current; Manufacturing industries; Manufacturing processes; Microstrip; Protons; Sensor phenomena and characterization; Silicon; Testing; Microstrip detector; p-bulk silicon; radiation assurance;
fLanguage :
English
Journal_Title :
Nuclear Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9499
Type :
jour
DOI :
10.1109/TNS.2009.2014162
Filename :
4812295
Link To Document :
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