Title :
A Comprehensive Methodology for Complex Field Programmable Gate Array Single Event Effects Test and Evaluation
Author :
Berg, Melanie D. ; LaBel, Kenneth A. ; Kim, Hak ; Friendlich, Mark ; Phan, Anthony ; Perez, Christopher
Author_Institution :
NASA Goddard Space Flight Center, Greenbelt, MD
fDate :
4/1/2009 12:00:00 AM
Abstract :
A methodology for evaluating various types of FPGAs targeted for space missions is presented. The premise is to supply unambiguous SEE information so that flight-projects may insert the optimal device for their application.
Keywords :
aerospace instrumentation; field programmable gate arrays; field programmable gate array; single event effects; space missions; test; triple mode redundancy; Aerospace electronics; Aerospace industry; Availability; Field programmable gate arrays; Manufacturing; NASA; Single event upset; Space technology; Switches; Testing; Evaluation; FPGA; Triple Mode Redundancy (TMR); scrubbing;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.2009.2013857
