Title :
Analytical results to account for delay measurement errors of high-speed VLSI devices
Author :
Mokari-Bolhassan, M.E.
Author_Institution :
Dept. of Electr. & Comput. Eng., Ohio Univ., Athens, OH, USA
fDate :
11/1/1989 12:00:00 AM
Abstract :
The transmission line effect in modern automatic test equipment (ATE) has been a major concern in measuring the timing of VLSI chips. The new version of test head has tried to terminate the transmission lines in matched loads at the comparator ends of the lines. This has eliminated the ringing effect. However, the new loading conditions for measurements are not likely to be according to specifications. Analytical results have been developed to correct the measurement errors incurred by different loading conditions. Chip-to-chip process variations have been incorporated
Keywords :
VLSI; automatic test equipment; delays; time measurement; automatic test equipment; comparator ends; delay measurement errors; high-speed VLSI devices; loading conditions; matched loads; measurement errors; ringing effect; test head; transmission line effect; Circuits; Delay effects; Inverters; MOS devices; Measurement errors; Semiconductor device measurement; Testing; Transmission line measurements; Transmission line theory; Very large scale integration;
Journal_Title :
Circuits and Systems, IEEE Transactions on