DocumentCode :
123179
Title :
Automated methods for eliminating X bugs
Author :
Kai-Hui Chang ; Yen-Ting Liu ; Browy, Chris
Author_Institution :
Avery Design Syst., Inc., Andover, MA, USA
fYear :
2014
fDate :
3-5 March 2014
Firstpage :
597
Lastpage :
603
Abstract :
Unknown values (Xs) may exist in a design due to uninitialized registers or blocks that are powered down. Due to limitations known as X-optimism and X-pessimism, such Xs cannot be handled correctly in logic simulation, producing inaccurate simulation values that can mask X bugs or corrupt simulation results. This can cause X bugs to escape verification and reduces design quality. To resolve such X-related issues, we propose a comprehensive methodology and several novel methods to detect masked Xs at the register transfer level and eliminate false Xs at the gate level. Our case studies show that the proposed methods are both effective and efficient.
Keywords :
formal verification; logic simulation; X bugs elimination; X-optimism; X-pessimism; automated methods; design quality reduction; formal verification; gate level; logic simulation; register transfer level; Algorithm design and analysis; Analytical models; Computer bugs; Integrated circuit modeling; Logic gates; Maintenance engineering; Registers; X verification; formal verification; logic simulation;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Quality Electronic Design (ISQED), 2014 15th International Symposium on
Conference_Location :
Santa Clara, CA
Print_ISBN :
978-1-4799-3945-9
Type :
conf
DOI :
10.1109/ISQED.2014.6783381
Filename :
6783381
Link To Document :
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