• DocumentCode
    123188
  • Title

    Simulation and satisfiability guided counter-example triage for RTL design debugging

  • Author

    Poulos, Zissis ; Yu-Shen Yang ; Veneris, Andreas ; Bao Le

  • Author_Institution
    Dept. of ECE, Univ. of Toronto, Toronto, ON, Canada
  • fYear
    2014
  • fDate
    3-5 March 2014
  • Firstpage
    618
  • Lastpage
    624
  • Abstract
    Regression verification flows in modern integrated circuit development environments expose a plethora of counterexamples during simulation. Sorting these counter-examples today is a tedious and time-consuming process. High level design debugging aims to triage these counter-examples into groups that will be assigned to the appropriate verification and/or design engineers for detailed root cause analysis. In this work, we present an automated triage process that leverages knowledge extracted from simulation and SAT-based debugging. We introduce novel metrics that correlate counter-examples based on the likelihood of sharing the same root cause. Triage is formulated as a pattern recognition problem and solved by hierarchical clustering techniques to generate groups of related counter-examples. Experimental results demonstrate an overall accuracy of 94% for the proposed automated triage framework, which corresponds to a 40% improvement over conventional scripting methods.
  • Keywords
    circuit CAD; computability; computer debugging; high level synthesis; integrated circuit design; pattern clustering; regression analysis; RTL design debugging; SAT-based debugging; automated triage process; hierarchical clustering techniques; high level design debugging; integrated circuit development environments; pattern recognition problem; register transfer level; regression verification; root cause analysis; satisfiability guided counter-example triage; scripting methods; Debugging; Estimation; Integrated circuit modeling; Measurement; Probabilistic logic; Silicon; Solid modeling;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Quality Electronic Design (ISQED), 2014 15th International Symposium on
  • Conference_Location
    Santa Clara, CA
  • Print_ISBN
    978-1-4799-3945-9
  • Type

    conf

  • DOI
    10.1109/ISQED.2014.6783384
  • Filename
    6783384