DocumentCode :
123188
Title :
Simulation and satisfiability guided counter-example triage for RTL design debugging
Author :
Poulos, Zissis ; Yu-Shen Yang ; Veneris, Andreas ; Bao Le
Author_Institution :
Dept. of ECE, Univ. of Toronto, Toronto, ON, Canada
fYear :
2014
fDate :
3-5 March 2014
Firstpage :
618
Lastpage :
624
Abstract :
Regression verification flows in modern integrated circuit development environments expose a plethora of counterexamples during simulation. Sorting these counter-examples today is a tedious and time-consuming process. High level design debugging aims to triage these counter-examples into groups that will be assigned to the appropriate verification and/or design engineers for detailed root cause analysis. In this work, we present an automated triage process that leverages knowledge extracted from simulation and SAT-based debugging. We introduce novel metrics that correlate counter-examples based on the likelihood of sharing the same root cause. Triage is formulated as a pattern recognition problem and solved by hierarchical clustering techniques to generate groups of related counter-examples. Experimental results demonstrate an overall accuracy of 94% for the proposed automated triage framework, which corresponds to a 40% improvement over conventional scripting methods.
Keywords :
circuit CAD; computability; computer debugging; high level synthesis; integrated circuit design; pattern clustering; regression analysis; RTL design debugging; SAT-based debugging; automated triage process; hierarchical clustering techniques; high level design debugging; integrated circuit development environments; pattern recognition problem; register transfer level; regression verification; root cause analysis; satisfiability guided counter-example triage; scripting methods; Debugging; Estimation; Integrated circuit modeling; Measurement; Probabilistic logic; Silicon; Solid modeling;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Quality Electronic Design (ISQED), 2014 15th International Symposium on
Conference_Location :
Santa Clara, CA
Print_ISBN :
978-1-4799-3945-9
Type :
conf
DOI :
10.1109/ISQED.2014.6783384
Filename :
6783384
Link To Document :
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