DocumentCode :
1232077
Title :
InP-Based Quantum-Dot Infrared Photodetectors With High Quantum Efficiency and High-Temperature Imaging
Author :
Tsao, Stanley ; Lim, Hochul ; Seo, Hosung ; Zhang, Wei ; Razeghi, Manijeh
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., Northwestern Univ., Evanston, IL
Volume :
8
Issue :
6
fYear :
2008
fDate :
6/1/2008 12:00:00 AM
Firstpage :
936
Lastpage :
941
Abstract :
We report a room temperature operating InAs quantum-dot infrared photodetector grown on InP substrate. The self-assembled InAs quantum dots and the device structure were grown by low-pressure metalorganic chemical vapor depositon. The detectivity was 6 times 1010 cm Hz1/2/W at 150 K and a bias of 5 V with a peak detection wavelength around 4.0 mum and a quantum efficiency of 48%. Due to the low dark current and high responsivity, a clear photoresponse has been observed at room temperature. A 320 times 256 middle wavelength infrared focal plane array operating at temperatures up to 200 K was also demonstrated. The focal plane array had 34 mA/W responsivity, 1.1% conversion efficiency, and noise equivalent temperature difference of 344 mK at 120 K operating temperature.
Keywords :
III-V semiconductors; MOCVD; focal planes; high-temperature effects; indium compounds; infrared detectors; photodetectors; semiconductor quantum dots; InAs-InP; InP; conversion efficiency; dark current; efficiency 48 percent; high-temperature imaging; low-pressure metalorganic chemical vapor depositon; middle wavelength infrared focal plane array; peak detection wavelength; quantum efficiency; quantum-dot infrared photodetector; self-assembled quantum dots; temperature 120 K; temperature 150 K; temperature 200 K; temperature 293 K to 298 K; Dark current; Detectors; Indium phosphide; Infrared imaging; Optical imaging; Photodetectors; Quantum dots; Semiconductor device noise; Sensor arrays; Temperature; Focal plane array; InP; infrared detectors; quantum dots;
fLanguage :
English
Journal_Title :
Sensors Journal, IEEE
Publisher :
ieee
ISSN :
1530-437X
Type :
jour
DOI :
10.1109/JSEN.2008.923940
Filename :
4529221
Link To Document :
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