Title :
Pattern Calculations for Antennas of Elliptical Aperture
Author :
Adams, R.J. ; Kelleher, K.S.
Author_Institution :
Naval Research Laboratory, Washington, D.C.
Keywords :
Antenna feeds; Antenna measurements; Aperture antennas; Attenuation measurement; Fourier series; Horn antennas; Knowledge engineering; Laboratories; Lighting; Reflector antennas;
Journal_Title :
Proceedings of the IRE
DOI :
10.1109/JRPROC.1950.229826
