Comparison of phase noise simulation techniques on a BJT LC oscillator

Author

Forbes, Leonard ; Zhang, Chengwei ; Zhang, Binglei ; Chandra, Yudi

Author_Institution

Dept. of Electr. & Comput. Eng., Oregon State Univ., Corvallis, OR, USA

Volume

50

Issue

6

fYear

2003

fDate

6/1/2003 12:00:00 AM

Firstpage

716

Lastpage

719

Abstract

The phase noise resulting from white and flicker noise in a bipolar junction transistor (BJT) LC oscillator is investigated. Large signal transient time domain SPICE simulations of phase noise resulting from the random-phase flicker and white noise in a 2 GHz BJT LC oscillator have been performed and demonstrated. The simulation results of this new technique are compared with Eldo RF and Spectre RF based on linear circuit concepts and experimental result reported in the literature.

Keywords

UHF oscillators; bipolar transistor circuits; circuit noise; circuit simulation; flicker noise; phase noise; time-domain analysis; transient analysis; white noise; 2 GHz; BJT LC oscillator; bipolar junction transistor oscillator; flicker noise; large signal SPICE simulations; phase noise simulation techniques; random-phase flicker; transient time domain SPICE simulations; white noise; 1f noise; Circuit noise; Circuit simulation; Mathematical model; Noise generators; Oscillators; Phase noise; Radio frequency; SPICE; White noise;

fLanguage

English

Journal_Title

Ultrasonics, Ferroelectrics, and Frequency Control, IEEE Transactions on

Publisher

ieee

ISSN

0885-3010

Type

jour

DOI

10.1109/TUFFC.2003.1209559

Filename

1209559