• DocumentCode
    1232459
  • Title

    Reflectometry by means of optical-coherence modulation

  • Author

    Hotate, Kazuo ; Kamatani, O.

  • Author_Institution
    Res. Center for Adv. Sci. & Technol., Tokyo Univ., Japan
  • Volume
    25
  • Issue
    22
  • fYear
    1989
  • Firstpage
    1503
  • Lastpage
    1505
  • Abstract
    Novel reflectometry with millimetre or submillimetre spatial resolution is proposed to evaluate optical components or circuits. The optical coherence is modulated to have a periodic delta-function shape along the optical path, and the backscattering intensity is obtained directly. The experiment demonstrates a resolution of about 10 mm in air with a Fabry-Perot laser diode.
  • Keywords
    backscatter; optical modulation; optical testing; reflectometry; Fabry-Perot laser diode; MM-wave spatial resolution; backscattering intensity; optical circuits evaluation; optical component testing; optical components; optical-coherence modulation; periodic delta-function shape; reflectometry; submillimetre spatial resolution;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19891009
  • Filename
    35162
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1232459