• DocumentCode
    1232777
  • Title

    Low-noise superconducting quantum interference device with a high dV/d/spl Phi/ optimized by thermally controlling critical current

  • Author

    Tsukada, K. ; Kawai, J. ; Takada, Y. ; Adachi, A.

  • Author_Institution
    Superconducting Sensor Lab., Chiba, Japan
  • Volume
    5
  • Issue
    3
  • fYear
    1995
  • Firstpage
    3488
  • Lastpage
    3493
  • Abstract
    The transfer function dV/d/spl Phi/ and the noise characteristics of a low-T/sub c/ superconducting quantum interference device (SQUID) have been improved by annealing to adjust the critical current, thereby optimizing the McCumber parameter /spl beta//sub c/. A SQUID structure suitable for annealing and using surface nitridation and planarization has also been developed. By annealing a SQUID that initially has a /spl beta//sub c/ greater than 1, the I-V characteristics can be changed from characteristics with hysteresis to characteristics without hysteresis. A SQUID with /spl beta//sub c/=0.81, close to the hysteresis limitation, had a large dV/d/spl Phi/ (3.7 mV//spl Phi/) and good noise characteristics (1.5 /spl mu//spl Phi//sub 0///spl radic/(Hz) at 100 Hz and 3.0 /spl mu//spl Phi//sub 0///spl radic/(Hz) at 1 Hz). These characteristics can be attained even when using a simple measuring circuit connected directly to preamplifier without adaptive components such as flux modulation or additional positive feedback (APF).<>
  • Keywords
    SQUIDs; annealing; critical currents; nitridation; superconducting device noise; superconducting device testing; transfer functions; 1 Hz; 100 Hz; 150 to 250 C; I-V characteristics; McCumber parameter optimization; SQUID fabrication; annealing; critical current control; dV/d/spl Phi/; direct preamplifier connection; flux locked loop operation; hysteresis limitation; low-T/sub c/ SQUID; low-noise superconducting quantum interference device; measuring circuit; noise characteristics; planarization; surface nitridation; transfer function; Annealing; Circuit noise; Critical current; Hysteresis; Interference; Planarization; SQUIDs; Superconducting device noise; Superconducting devices; Transfer functions;
  • fLanguage
    English
  • Journal_Title
    Applied Superconductivity, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1051-8223
  • Type

    jour

  • DOI
    10.1109/77.413156
  • Filename
    413156