Title :
Use of Thermal Waves for Microscopic NDT Purposes
Author :
Jaarinen, Jussi P. ; Rajala, Risto Y. ; Tiusanen, Tapani P. ; Luukkala, Mauri
fDate :
3/1/1985 12:00:00 AM
Keywords :
Frequency; Infrared detectors; Microscopy; Photothermal effects; Size measurement; Steel; Surface emitting lasers; Surface waves; Time measurement; Velocity measurement;
Journal_Title :
Sonics and Ultrasonics, IEEE Transactions on
DOI :
10.1109/T-SU.1985.31605
