DocumentCode :
1232873
Title :
Optimal automatic control of multistage production processes
Author :
Fenner, Joel S. ; Jeong, Myong K. ; Lu, Jye-Chyi
Author_Institution :
Intel Corp., Hillsboro, OR, USA
Volume :
18
Issue :
1
fYear :
2005
Firstpage :
94
Lastpage :
103
Abstract :
Today´s high-tech industries produce complicated products involving many processing steps. The usual approach of modeling and controlling each of these steps in isolation is re-evaluated. This work develops a data model of synchronized observations collected from several stages of a multistage manufacturing process, and proposes an across-stage automatic control scheme for adjusting nonstationary process drifts. The proposed controller applies dynamic programming tools to optimize multiple goals specified for individual process stages and possible mismatch between stages. Several examples and simulation studies demonstrate that the proposed method is a valuable tool for improving semiconductor manufacturing quality.
Keywords :
dynamic programming; multivariable control systems; optimal control; process control; production control; semiconductor process modelling; across-stage automatic control scheme; data model; high-tech industries; multistage manufacturing process; multistage production processes; nonstationary process drifts; optimal automatic control; proposed controller applies dynamic programming tools; semiconductor manufacturing quality; Automatic control; Data models; Dynamic programming; Error correction; Manufacturing industries; Manufacturing processes; Optimal control; Process control; Production; Virtual manufacturing;
fLanguage :
English
Journal_Title :
Semiconductor Manufacturing, IEEE Transactions on
Publisher :
ieee
ISSN :
0894-6507
Type :
jour
DOI :
10.1109/TSM.2004.840532
Filename :
1393049
Link To Document :
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