• DocumentCode
    1232909
  • Title

    Development of a web-services-based e-diagnostics framework for semiconductor manufacturing industry

  • Author

    Hung, Min-Hsiung ; Cheng, Fan-tien ; Yeh, Sze-Chien

  • Author_Institution
    Dept. of Electr. Eng., Nat. Defense Univ., Taiwan
  • Volume
    18
  • Issue
    1
  • fYear
    2005
  • Firstpage
    122
  • Lastpage
    135
  • Abstract
    Recently, the emerging Web-Services technology has provided a new and excellent solution to the data integration among heterogeneous systems. A Web-Services-based e-diagnostics framework (WSDF) is proposed. It can achieve the automation of diagnostic processes and diagnostics information integration for semiconductor equipment. First, the system framework and the system component model are designed. Then, the object-oriented analysis and design of system components are accomplished. In particular, for the purpose of code reuse, several common functions, such as simple object access protocol communication, universal description discovery and integration registration, security mechanism, data exchange mechanism, and local database access, are built into a generic component called Web-Service agent. By inheriting the Web-service agent, other system components can be constructed and have these common functions. In addition, a unified authentication-service mechanism and a safe network connection are also designed in the framework. WSDF is intended to support the e-diagnostics functions defined by International SEMATECH. It is believed that WSDF can be applied to construct e-diagnostics systems for the semiconductor manufacturing industry.
  • Keywords
    Internet; electronic data interchange; electronics industry; fault diagnosis; object-oriented methods; semiconductor technology; Web-Service agent; Web-Services technology; Web-Services-based e-diagnostics framework; code reuse; data exchange mechanism; data integration; diagnostic process automation; diagnostics information integration; generic component; heterogeneous systems; integration registration; international SEMATECH; local database access; object-oriented analysis; object-oriented design; safe network connection; security mechanism; semiconductor equipment; semiconductor manufacturing industry; simple object access protocol communication; unified authentication-service mechanism; universal description discovery; Aerospace industry; Cement industry; Collaboration; Manufacturing automation; Manufacturing industries; Performance analysis; Performance loss; Predictive maintenance; Production facilities; Remote monitoring;
  • fLanguage
    English
  • Journal_Title
    Semiconductor Manufacturing, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0894-6507
  • Type

    jour

  • DOI
    10.1109/TSM.2004.836664
  • Filename
    1393052