DocumentCode :
1232985
Title :
Equipment effectiveness: OEE revisited
Author :
de Ron, A.J. ; Rooda, J.E.
Author_Institution :
Syst. Eng. Group, Eindhoven Univ. of Technol., Netherlands
Volume :
18
Issue :
1
fYear :
2005
Firstpage :
190
Lastpage :
196
Abstract :
Overall equipment effectiveness (OEE) is a metric that has been accepted completely in the semiconductor industry. OEE is simple and clear, and standards and guidelines have been developed. Nonetheless, literature indicates imperfections in applying OEE with regard to time base and rate efficiency. As literature lacks a basic framework for OEE, effectiveness has been approached systematically that resulted in a new equipment effectiveness E. The main difference between OEE and E concerns the choice of the time base. OEE does include equipment-independent conditions, such as lack of input items. This condition is not caused by the equipment but by the environment of the equipment. E has been defined to get a performance measure that is related to equipment-dependent states only, viz. effective state consisting of productive state, scheduled down state, and unscheduled down state. Because of the stand-alone condition, the equipment effectiveness expresses the (equipment) internal losses, while utilization expresses the external losses. By using E, equipment can be compared and improved. It can be concluded that the advantage of E over OEE is that real equipment effectiveness is measured as the influence of utilization (equipment-independent conditions) is eliminated.
Keywords :
electronics industry; production equipment; equipment dependent states; equipment independent conditions; external losses; internal losses; overall equipment effectiveness; productive state; rate efficiency; semiconductor industry; time base; Electronics industry; Guidelines; Job shop scheduling; Measurement standards; Mechanical engineering; Performance evaluation; Productivity; Semiconductor materials; Standards development; Systems engineering and theory;
fLanguage :
English
Journal_Title :
Semiconductor Manufacturing, IEEE Transactions on
Publisher :
ieee
ISSN :
0894-6507
Type :
jour
DOI :
10.1109/TSM.2004.836657
Filename :
1393059
Link To Document :
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