DocumentCode :
1232995
Title :
An evaluation of deadlock-handling strategies in semiconductor cluster tools
Author :
Venkatesh, Srilakshmi ; Smith, Jeffrey S.
Author_Institution :
Hewlett-Packard Co., Sunnyvale, CA, USA
Volume :
18
Issue :
1
fYear :
2005
Firstpage :
197
Lastpage :
201
Abstract :
We study the deadlock handling performance of a single-blade cluster tool and present a comparison of average flowtimes under deadlock detection and resolution versus prevention. Two detection and resolution policies are tested: either resolve permanent deadlocks or resolve both permanent and transient deadlocks. A permanent deadlock requires external intervention to resolve the deadlock, whereas a transient deadlock has a positive probability that the deadlock will resolve itself over time. Prevention averts deadlock by providing sufficient in-process buffer spaces. Our experiments indicate interplay of process and robot transfer times dictate the choice of deadlock strategy. Under low robot transfer times relative to process times, providing sufficient in-process buffer to prevent deadlock or resolving both permanent and transient deadlocks can be equally effective. We conclude with some practical guidelines for operating and designing cluster tools under deadlock conditions.
Keywords :
cluster tools; electronics industry; flexible manufacturing systems; machine tools; production management; resource allocation; deadlock detection; deadlock handling strategy; deadlock resolution; external intervention; in-process buffer spaces; permanent deadlock; process times; resolution policy; robot transfer times; semiconductor cluster tools; single blade cluster tool; transient deadlock; Control systems; Guidelines; Manufacturing systems; Orbital robotics; Resource management; Robot kinematics; Robotics and automation; Routing; System recovery; Testing;
fLanguage :
English
Journal_Title :
Semiconductor Manufacturing, IEEE Transactions on
Publisher :
ieee
ISSN :
0894-6507
Type :
jour
DOI :
10.1109/TSM.2004.836658
Filename :
1393060
Link To Document :
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