• DocumentCode
    1233029
  • Title

    Detection of echoes using time-frequency analysis techniques

  • Author

    Daponte, Pasquale ; Fazio, Giuseppe ; Molinaro, Anna

  • Author_Institution
    Dept. of Comput. Sci., Salerno Univ., Italy
  • Volume
    45
  • Issue
    1
  • fYear
    1996
  • fDate
    2/1/1996 12:00:00 AM
  • Firstpage
    30
  • Lastpage
    40
  • Abstract
    The following is a presentation of echo detection techniques based on time-frequency signal analysis for the measuring of thickness in thin multilayer structures. These techniques are shown to provide high-resolution signal characterization in a time-frequency space, and good noise rejection performance. In particular, the short-time Fourier transform, the Gabor expansion, the cross-ambiguity function and the Wigner-Ville distribution are analyzed and compared with techniques such as the logarithmic power spectrum, cepstrum and the segmented chirp Z-Transform. A suitable operating procedure was set up, based on an initial emulation phase in which simulated signals were considered, followed by a second phase in which real signals were processed. The results show the optimum performances of these new techniques compared with the traditional ones and, in particular, that the accurate measurement of thickness can be obtained also when waveform transients partially overlap
  • Keywords
    Fourier transforms; Wigner distribution; Z transforms; cepstral analysis; echo; signal processing; thickness measurement; time-frequency analysis; Gabor expansion; Wigner-Ville distribution; cepstrum; cross-ambiguity function; echo detection; emulation phase; high-resolution; logarithmic power spectrum; measurement of thickness; noise rejection; optimum performances; segmented chirp Z-Transform; short-time Fourier transform; simulated signals; thin multilayer structures; time-frequency analysis; time-frequency signal analysis; time-frequency space; waveform transients; Cepstral analysis; Cepstrum; Chirp; Emulation; Fourier transforms; Nonhomogeneous media; Signal analysis; Signal processing; Thickness measurement; Time frequency analysis;
  • fLanguage
    English
  • Journal_Title
    Instrumentation and Measurement, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9456
  • Type

    jour

  • DOI
    10.1109/19.481308
  • Filename
    481308