• DocumentCode
    1233324
  • Title

    CT Saturation Calculations: Are They Applicable in the Modern World?—Part I: The Question

  • Author

    Cossé, Roy E. ; Dunn, Donald G. ; Spiewak, Robert M.

  • Author_Institution
    Powell Electr. Syst., Inc, Houston, TX
  • Volume
    43
  • Issue
    2
  • fYear
    2007
  • Firstpage
    444
  • Lastpage
    452
  • Abstract
    Previously, ANSI/IEEE relay current transformer (CT) sizing criteria were based on traditional symmetrical calculations that are usually discussed by technical articles and manufacturers´ guidelines. In 1996, IEEE Standard C37.110-1996 introduced (1+X/R) offset multiplying, current asymmetry, and current distortion factors, officially changing the CT sizing guideline. A critical concern is the performance of fast protective schemes (instantaneous or differential elements) during severe saturation of low-ratio CTs. Will the instantaneous element operate before the upstream breaker relay trips? Will the differential element misoperate for out-of-zone faults? The use of electromagnetic and analog relay technology does not assure selectivity. Modern microprocessor relays introduce additional uncertainty into the design/verification process with different sampling techniques and proprietary sensing/recognition/trip algorithms. This paper discusses the application of standard CT accuracy classes with modern ANSI/IEEE CT calculation methodology. This paper is the first of a two-part series; Part II provides analytical waveform analysis discussions to illustrate the concepts conveyed in Part I
  • Keywords
    current transformers; power transformer protection; relay protection; sampling methods; IEEE Standard; analytical waveform analysis; current asymmetry; current distortion factors; design-verification process; electromagnetic misoperation; microprocessor relays; proprietary sensing-recognition-trip algorithms; protective schemes; relay current transformer sizing criteria; sampling techniques; upstream breaker relay; Circuit faults; Current transformers; Fault currents; Guidelines; Manufacturing; Microprocessors; Protection; Protective relaying; Relays; Uncertainty; $X/R$ ratio; Accuracy class; CT saturation; asymmetrical current; current transformer (CT) burden; digital filter; direct current (dc) offset;
  • fLanguage
    English
  • Journal_Title
    Industry Applications, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0093-9994
  • Type

    jour

  • DOI
    10.1109/TIA.2006.890023
  • Filename
    4132861