DocumentCode :
1233324
Title :
CT Saturation Calculations: Are They Applicable in the Modern World?—Part I: The Question
Author :
Cossé, Roy E. ; Dunn, Donald G. ; Spiewak, Robert M.
Author_Institution :
Powell Electr. Syst., Inc, Houston, TX
Volume :
43
Issue :
2
fYear :
2007
Firstpage :
444
Lastpage :
452
Abstract :
Previously, ANSI/IEEE relay current transformer (CT) sizing criteria were based on traditional symmetrical calculations that are usually discussed by technical articles and manufacturers´ guidelines. In 1996, IEEE Standard C37.110-1996 introduced (1+X/R) offset multiplying, current asymmetry, and current distortion factors, officially changing the CT sizing guideline. A critical concern is the performance of fast protective schemes (instantaneous or differential elements) during severe saturation of low-ratio CTs. Will the instantaneous element operate before the upstream breaker relay trips? Will the differential element misoperate for out-of-zone faults? The use of electromagnetic and analog relay technology does not assure selectivity. Modern microprocessor relays introduce additional uncertainty into the design/verification process with different sampling techniques and proprietary sensing/recognition/trip algorithms. This paper discusses the application of standard CT accuracy classes with modern ANSI/IEEE CT calculation methodology. This paper is the first of a two-part series; Part II provides analytical waveform analysis discussions to illustrate the concepts conveyed in Part I
Keywords :
current transformers; power transformer protection; relay protection; sampling methods; IEEE Standard; analytical waveform analysis; current asymmetry; current distortion factors; design-verification process; electromagnetic misoperation; microprocessor relays; proprietary sensing-recognition-trip algorithms; protective schemes; relay current transformer sizing criteria; sampling techniques; upstream breaker relay; Circuit faults; Current transformers; Fault currents; Guidelines; Manufacturing; Microprocessors; Protection; Protective relaying; Relays; Uncertainty; $X/R$ ratio; Accuracy class; CT saturation; asymmetrical current; current transformer (CT) burden; digital filter; direct current (dc) offset;
fLanguage :
English
Journal_Title :
Industry Applications, IEEE Transactions on
Publisher :
ieee
ISSN :
0093-9994
Type :
jour
DOI :
10.1109/TIA.2006.890023
Filename :
4132861
Link To Document :
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