Title :
A sensitivity figure for yield improvement [manufacturable microwave circuit design]
Author :
Purviance, John E. ; Meehan, Michael D.
Author_Institution :
Dept. of Electr. Eng., Idaho Univ., Moscow, ID, USA
fDate :
2/1/1988 12:00:00 AM
Abstract :
A network sensitivity figure for use in gradient-type optimizers which accounts for random parameter variations encountered during manufacturing is introduced. The difference between conventional sensitivity descriptions and the authors´ sensitivity figure is analyzed and explained. Two examples are presented where yield improvement is obtained using the new sensitivity figure in a gradient-type optimizer
Keywords :
integrated circuit manufacture; microwave integrated circuits; multiport networks; network synthesis; optimisation; sensitivity analysis; gradient-type optimizers; interconnected two-port networks; microwave circuit design; network sensitivity; random parameter variations; yield improvement; Circuit optimization; Circuit synthesis; Design optimization; Fabrication; Gradient methods; Manufacturing; Manufacturing processes; Optimization methods; Process design; Production; Sensitivity analysis;
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
