DocumentCode :
1233652
Title :
A Serpentine Guard Trace to Reduce the Far-End Crosstalk Voltage and the Crosstalk Induced Timing Jitter of Parallel Microstrip Lines
Author :
Lee, Kyoungho ; Lee, Hyun-Bae ; Jung, Hae-Kang ; Sim, Jae-Yoon ; Park, Hong-June
Author_Institution :
Dept. of Electron. & Electr. Eng., Pohang Univ. of Sci. & Technol., Pohang
Volume :
31
Issue :
4
fYear :
2008
Firstpage :
809
Lastpage :
817
Abstract :
A serpentine guard trace is proposed to reduce the peak far-end crosstalk voltage and the crosstalk induced timing jitter of parallel microstrip lines on printed circuit boards. The vertical sections of the serpentine guard increase the mutual capacitance without much changing the mutual inductance between the aggressor and victim lines. This reduces the difference between the capacitive and inductive couplings and hence the far-end crosstalk. Comparison with the no guard, the conventional guard, and the via-stitch guard shows that the serpentine guard gives the smallest values in both the peak far-end crosstalk voltage and the timing jitter. The time domain reflectometer (TDR) measurement shows that the peak far-end crosstalk voltage of serpentine guard is reduced to 44% of that of no guard. The eye diagram measurement of pseudo random binary sequence (PRBS) data shows that the timing jitter is also reduced to 40% of that of no guard.
Keywords :
crosstalk; microstrip lines; printed circuits; random number generation; timing jitter; capacitive couplings; crosstalk induced timing jitter; eye diagram measurement; far-end crosstalk voltage; inductive couplings; mutual capacitance; parallel microstrip lines; printed circuit boards; pseudorandom binary sequence data; serpentine guard trace; time domain reflectometer measurement; Crosstalk; microstrip line; serpentine guard trace; timing jitter;
fLanguage :
English
Journal_Title :
Advanced Packaging, IEEE Transactions on
Publisher :
ieee
ISSN :
1521-3323
Type :
jour
DOI :
10.1109/TADVP.2008.924226
Filename :
4530751
Link To Document :
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