Title :
Frequency Response of Cermet Resistors for Hybrid Microcircuits
Author_Institution :
CTS Microelectronics, Inc. West Lafayette, Indiana
Keywords :
Admittance measurement; Ceramics; Electrodes; Frequency response; Hybrid integrated circuits; Impedance measurement; Length measurement; Oscillators; Resistors; Transmission line measurements;
Journal_Title :
Broadcast and Television Receivers, IEEE Transactions on
DOI :
10.1109/TBTR1.1967.4320091
