• DocumentCode
    1233687
  • Title

    Improved one-band self-consistent effective mass methods for hole quantization in p-MOSFET

  • Author

    Low, Tony ; Hou, Yong-Tian ; Li, Ming-Fu

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Nat. Univ. of Singapore, Singapore
  • Volume
    50
  • Issue
    5
  • fYear
    2003
  • fDate
    5/1/2003 12:00:00 AM
  • Firstpage
    1284
  • Lastpage
    1289
  • Abstract
    An improved one-band self-consistent effective mass approximation (EMA) for hole quantization in p-MOSFET is presented. It is developed by extracting empirically a set of hole-effective masses based on the rigorous self-consistent six-band EMA. It is found that the self-consistent model using such improved one-band effective masses can provide accurate hole quantization characteristics. For further simplification, the triangular well approximation is also assessed. Fairly accurate MOS electrostatics is also obtained if introducing an effective field in the inversion layer in triangular well approximation. However, the triangular well approximation has its limitation in describing the hole centroid. In essence, the shorter computing time of the proposed improved one-band methods without sacrificing the accuracy of MOS electrostatics provides its potential in device modeling for hole quantization.
  • Keywords
    MOSFET; electrostatic discharge; inversion layers; semiconductor device models; MOS electrostatics; computing time; device modeling; effective mass approximation; hole centroid; hole quantization; hole quantization characteristics; hole-effective masses; inversion layer; one-band effective masses; one-band methods; one-band self-consistent effective mass methods; p-MOSFET; rigorous self-consistent six-band EMA; self-consistent model; triangular well approximation; Effective mass; Electrostatics; MOS devices; MOSFET circuits; Poisson equations; Quantization; Semiconductor device modeling; Silicon; Wave functions; Weight control;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/TED.2003.813469
  • Filename
    1210777