DocumentCode :
1233932
Title :
High turn-off current capability of parallel-connected 4.5 kV trench IEGT
Author :
Ogura, Tsuneo ; Sugiyama, Koichi ; Ninomiya, Hideaki ; Inoue, Tomoki ; Hasegawa, Shigeru ; Matsuda, Hideo ; Ohashi, Hiromichi
Author_Institution :
Discrete Semicond. Div., Toshiba Corp., Kawasaki, Japan
Volume :
50
Issue :
5
fYear :
2003
fDate :
5/1/2003 12:00:00 AM
Firstpage :
1392
Lastpage :
1397
Abstract :
An injection enhancement IGBT (IEGT) is a high-power switching device that realizes low saturation voltage by the injection enhancement effect (IE-effect). The experimental results obtained by the IE-effect are presented. The trench IEGTs with 6- and 12-μm trench depth were compared with a planar IEGT. These experimental results show that the trench IEGT has a better trade-off relation between saturation voltage and turn-off loss than the planar IEGT. Moreover, the trench IEGT with 12-μm trench depth has a better trade-off relation than that with 6-μm trench depth. These results prove clearly that the IE-effect improves the trade-off relation. Turn-off characteristics of parallel-connected 4.5 kV trench IEGTs are discussed. The influence of the gate circuit parameters on a turn-off current balance was examined in order to realize high turn-off current capability. It is concluded that the reduction of the gate parasitic inductance is important for uniform turn-off operation. At optimum gate circuit condition, it is shown that the maximum turn-off current increases in proportion to the number of IEGT chips. As a result, a 1300-A turn-off current capability was obtained using nine parallel-connected IEGT chips in an inductive load circuit and without any snubber circuits. In conclusion, the IEGT has a good prospect of replacing the gate turn-off thyristor (GTO) for high-voltage applications, such as motor controls for traction, industrial motor drives, and so on.
Keywords :
inductance; insulated gate bipolar transistors; losses; power semiconductor switches; power transistors; semiconductor device breakdown; 12 micron; 1300 A; 4.5 kV; 6 micron; HV applications; gate circuit parameters; gate parasitic inductance reduction; high turn-off current capability; high-power switching device; high-voltage applications; inductive load circuit; injection enhancement IGBT; maximum turn-off current; optimum gate circuit condition; parallel-connected IEGT chips; power semiconductor devices; saturation voltage; semiconductor device breakdown; trench IEGT; turn-off characteristics; turn-off current balance; turn-off loss; uniform turn-off operation; Bipolar transistors; Inductance; Industrial control; Insulated gate bipolar transistors; Low voltage; MOSFET circuits; Motor drives; Power MOSFET; Snubbers; Thyristors;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/TED.2003.813465
Filename :
1210803
Link To Document :
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