• DocumentCode
    1233983
  • Title

    Well-behaved global on-chip interconnect

  • Author

    Caputa, Peter ; Svensson, Christer

  • Author_Institution
    Dept. of Electr. Eng., Linkoping Univ., Sweden
  • Volume
    52
  • Issue
    2
  • fYear
    2005
  • Firstpage
    318
  • Lastpage
    323
  • Abstract
    Global interconnects have been identified as a serious limitation to chip scaling, due to their latency and power consumption. We demonstrate a scheme to overcome these limitations, based on the utilization of upper-level metals, combined with structured communication architecture. Microwave style transmission lines in upper-level metals allow close-to-velocity-of-light delays if properly dimensioned. As an example, we demonstrate a 480-μm-wide and 20-mm-long bus with a capacity of 320 Gb/s in a nearly standard 0.18-μm process. The process differs from a standard process only through a somewhat thicker outer metal layer. We further illustrate how "self pre-emphasis" at the launch of a data pulse can be used to double the maximum available data rate over a wire. The proposed techniques are scalable, given that higher level metals are properly dimensioned in future processes.
  • Keywords
    chip scale packaging; delays; integrated circuit design; integrated circuit interconnections; integrated circuit metallisation; 0.18 micron; chip scaling; communication architecture; data pulse; global interconnect; interconnect delay; on chip bus; power consumption; transmission lines; upper level metals; Delay; Impedance; Inductance; Integrated circuit interconnections; Intersymbol interference; Propagation losses; Skin effect; Transfer functions; Transmission line theory; Wire; Interconnect; global interconnect; interconnect delay; on-chip bus; upper-level metal;
  • fLanguage
    English
  • Journal_Title
    Circuits and Systems I: Regular Papers, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1549-8328
  • Type

    jour

  • DOI
    10.1109/TCSI.2004.840483
  • Filename
    1393164