DocumentCode :
1234253
Title :
Achieving Less Than 2% 3- σ Mismatch With Minimum Channel-Length CMOS Devices
Author :
Gupta, Vishal ; Rincón-Mora, Gabriel A.
Author_Institution :
Sch. of Electr. & Comput. Eng., Georgia Inst. of Technol., Atlanta, GA
Volume :
54
Issue :
3
fYear :
2007
fDate :
3/1/2007 12:00:00 AM
Firstpage :
232
Lastpage :
236
Abstract :
Offset and speed are critical yet conflicting design parameters in high-speed amplifiers and comparators, especially those used to process the characteristically high-frequency low-amplitude signals of today´s wireless transceiver systems. As device area is decreased to reduce parasitic capacitances and hence achieve higher bandwidth, random mismatches inherently increase. The proposed Survivor strategy circumvents this tradeoff by fabricating a number of small-geometry device pairs on-chip (each of which have high bandwidth) and having the IC self-select the best-matched set of devices during start-up and/or power-on-reset events and use them in critical portions of the circuit. In the experiments conducted on a prototype fabricated using a 0.6-mum CMOS technology, a mirror using the best-matched minimum channel-length pair chosen from a bank of 32 pairs (6 mum/0.6 mum) had a 3-sigma offset performance (1.94%) similar to that of a mirror using 48 mum/4.8 mum devices (1.91%) and hence a bandwidth that was 64 times higher (BW6/0.6ap64BW48/4.8)
Keywords :
1/f noise; CMOS analogue integrated circuits; amplifiers; comparators (circuits); decision circuits; high-speed integrated circuits; transceivers; 0.6 micron; 48 micron; CMOS devices; IC; calibration; design parameters; high-frequency low-amplitude signals; high-speed amplifiers; high-speed comparators; parasitic capacitances; wireless transceiver systems; Bandwidth; CMOS technology; Capacitors; Circuits; Costs; Electronics packaging; Instruments; Mirrors; Packaging machines; Signal design; Calibration; mismatch; offset; trimming;
fLanguage :
English
Journal_Title :
Circuits and Systems II: Express Briefs, IEEE Transactions on
Publisher :
ieee
ISSN :
1549-7747
Type :
jour
DOI :
10.1109/TCSII.2006.888736
Filename :
4132959
Link To Document :
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