Title :
Dielectric constant, loss tangent, and surface resistance of PCB materials at K-band frequencies
Author :
Egorov, Victor N. ; Masalov, Vladimir L. ; Nefyodov, Yuri A. ; Shevchun, Artem F. ; Trunin, Mikhail R. ; Zhitomirsky, Victor E. ; McLean, Mick
Author_Institution :
East-Siberian Res. Inst. of Physico-Tech. & Radioengineering Meas.s, Irkutsk
Abstract :
This paper develops the theoretical approach and describes the design of a practical test rig for measuring the microwave parameters of unclad and laminated dielectric substrates. The test rig is based on a sapphire whispering-gallery resonator and allows the measurement of the following parameters: dielectric constant (epsiv) of the dielectric substrate in the range from 2 to 10, loss tangent (tandelta) of the dielectric substrate in the range from 10-4 to 10-2, and microwave losses of copper coating of the substrate in the range from 0.03 to 0.3 Omega. Measurements of numerous commonly used microwave printed-circuit-board materials were performed at frequencies between 30-40 GHz and over a temperature range of -50degC to +70degC
Keywords :
dielectric losses; dielectric materials; dielectric resonators; permittivity; printed circuits; sapphire; surface resistance; -50 to 70 degC; 0.03 to 0.3 ohm; 30 to 40 GHz; Al2O3; K-band frequencies; PCB materials; copper coating; dielectric constant; laminated dielectric substrate; loss tangent; microwave losses; microwave parameter measurement; microwave printed circuit board materials; practical test rig; sapphire whispering gallery resonator; surface resistance; Dielectric constant; Dielectric loss measurement; Dielectric losses; Dielectric materials; Dielectric measurements; Dielectric substrates; Frequency; K-band; Microwave measurements; Surface resistance; Anisotropy; complex permittivity; dielectric resonator (DR); resonance spectrum; surface resistance; whispering-gallery (WG) modes;
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
DOI :
10.1109/TMTT.2004.841219
