DocumentCode :
1234858
Title :
Commentary: Material Review Board in 2003
Author :
McLinn, James A.
Volume :
52
Issue :
2
fYear :
2003
fDate :
6/1/2003 12:00:00 AM
Firstpage :
148
Lastpage :
148
Keywords :
Chapters; Engineering management; Failure analysis; Manufacturing; Pacemakers; Quality management; Reliability engineering; Semiconductor device reliability; Systems engineering and theory; Total quality management;
fLanguage :
English
Journal_Title :
Reliability, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9529
Type :
jour
DOI :
10.1109/TR.2003.811161
Filename :
1211102
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1234858
