Optimisation and regularisation in microwave diagnostics of semiconductors having smooth and unsmooth functions

A new microwave iterative technique for obtaining the inhomogeneous profile of semiconductor permittivity and conductivity is optimised. The optimum physical conditions for applying the gradient method in solving microwave inverse problems are studied and underlined. A new regularisation approach is applied to improve the profiles of oscillating solutions. Numerical experiments are used to prove the validity of this technique in solving ill-posed problems.