• DocumentCode
    1234985
  • Title

    On the design and generation of the double exponential function

  • Author

    Dutta Roy, S.C. ; Bhargava, D.K.

  • Author_Institution
    Dept. of Electr. Eng., Indian Inst. of Technol., New Delhi, India
  • Volume
    45
  • Issue
    1
  • fYear
    1996
  • fDate
    2/1/1996 12:00:00 AM
  • Firstpage
    309
  • Lastpage
    312
  • Abstract
    For the double exponential function f(t)=K(e-at-e-bt), which is used for impulse testing of electrical components and systems, we derive an approximate relation between the ratio ym=Tm/Tmax, where Tmax and Tm are, respectively, the times to reach the peak value Fmax and the value Fmax/m on the tail of the pulse, and the ratio x=b/a. This relation is useful for finding x for a prescribed ym, where m is usually equal to 2. Our formula is much simpler than that given by Googe, Ewing and Hess (1992), but gives results of comparable accuracy. We also present a number of RC two-ports for generating the test function f(t) from an impulse function δ(t), as well as from the step function u(t)
  • Keywords
    RC circuits; electronic equipment testing; impulse testing; network synthesis; pulse generators; two-port networks; RC two-ports; approximate relation; design; double exponential function; electrical components; impulse testing; EMP radiation effects; Electromagnetic transients; Equations; Impulse testing; Joining processes; Lightning; System testing; Tail;
  • fLanguage
    English
  • Journal_Title
    Instrumentation and Measurement, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9456
  • Type

    jour

  • DOI
    10.1109/19.481355
  • Filename
    481355