DocumentCode :
1234985
Title :
On the design and generation of the double exponential function
Author :
Dutta Roy, S.C. ; Bhargava, D.K.
Author_Institution :
Dept. of Electr. Eng., Indian Inst. of Technol., New Delhi, India
Volume :
45
Issue :
1
fYear :
1996
fDate :
2/1/1996 12:00:00 AM
Firstpage :
309
Lastpage :
312
Abstract :
For the double exponential function f(t)=K(e-at-e-bt), which is used for impulse testing of electrical components and systems, we derive an approximate relation between the ratio ym=Tm/Tmax, where Tmax and Tm are, respectively, the times to reach the peak value Fmax and the value Fmax/m on the tail of the pulse, and the ratio x=b/a. This relation is useful for finding x for a prescribed ym, where m is usually equal to 2. Our formula is much simpler than that given by Googe, Ewing and Hess (1992), but gives results of comparable accuracy. We also present a number of RC two-ports for generating the test function f(t) from an impulse function δ(t), as well as from the step function u(t)
Keywords :
RC circuits; electronic equipment testing; impulse testing; network synthesis; pulse generators; two-port networks; RC two-ports; approximate relation; design; double exponential function; electrical components; impulse testing; EMP radiation effects; Electromagnetic transients; Equations; Impulse testing; Joining processes; Lightning; System testing; Tail;
fLanguage :
English
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9456
Type :
jour
DOI :
10.1109/19.481355
Filename :
481355
Link To Document :
بازگشت