DocumentCode
1235086
Title
Development of a new low-stress hyperred LED encapsulant
Author
Zwiers, Renso J M ; Bressers, Hendrik J L ; Ouwehand, Berry ; Baumann, Dieter
Author_Institution
Philips Centre for Manuf. Technol., Eindhoven, Netherlands
Volume
12
Issue
3
fYear
1989
fDate
9/1/1989 12:00:00 AM
Firstpage
387
Lastpage
392
Abstract
The development of a transparent encapsulant for a hyperred LED is presented. The encapsulant was evaluated and compared with various encapsulants from several suppliers. All encapsulants were evaluated by monitoring the behavior of the LEDs in laboratory quality tests and performing failure analysis. The correlation between chemistry and final optical and mechanical properties of the encapsulant, plus their influence on the lifetime of the LED crystal, is elucidated. Three failure mechanisms are commonly observed: corrosion, mechanical stress, and open circuits due to wire breaking. By careful selection of chemistry and optimization of processing and manufacturing procedures, these can be circumvented. The resulting LED has a high light output, good stability during operation under various conditions, and few open circuits in temperature cycling, even after 200 cycles. Finally, the encapsulant does not show any yellowing under extreme weathering conditions or during lifetime
Keywords
encapsulation; light emitting diodes; materials testing; corrosion; failure analysis; failure mechanisms; hyperred LED; laboratory quality tests; mechanical stress; open circuits; temperature cycling; transparent encapsulant; wire breaking; Chemistry; Circuit testing; Condition monitoring; Corrosion; Failure analysis; Laboratories; Light emitting diodes; Mechanical factors; Performance evaluation; Stress;
fLanguage
English
Journal_Title
Components, Hybrids, and Manufacturing Technology, IEEE Transactions on
Publisher
ieee
ISSN
0148-6411
Type
jour
DOI
10.1109/33.35486
Filename
35486
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