• DocumentCode
    1235116
  • Title

    Oxidation behavior of AlN in the presence of oxide and glass for thick film applications

  • Author

    Yamaguchi, Takashi ; Kageyama, Makiko

  • Author_Institution
    Fac. of Sci. & Technol., Keio Univ., Yokohama, Japan
  • Volume
    12
  • Issue
    3
  • fYear
    1989
  • fDate
    9/1/1989 12:00:00 AM
  • Firstpage
    402
  • Lastpage
    405
  • Abstract
    The effect of oxides and oxide glasses on the oxidation of AlN powder and substrate was studied by thermogravimetric analysis, supplemented by XRD, optical microscopy, and EPMA. The oxidation behavior of powder mixtures of AlN and oxides or glass frits in air was dependent on the oxide species. Oxides were divided into three groups: PbO, CuO, and Bi2O3 promoted the oxidation drastically, ZnO and MgO enhanced the oxidation slightly, and B2 O3 retarded the oxidation of AlN. SiO2 and Al2O3 had no influence on the oxidation. Also reported is a study of the interactions between the AlN substrate and PbO-containing glasses
  • Keywords
    aluminium compounds; materials testing; oxidation; substrates; thick film circuits; Al2O3; AlN powder oxidation; AlN-Al2O3; AlN-B2O3; AlN-Bi2O3; AlN-CuO; AlN-MgO; AlN-PbO; AlN-SiO2; AlN-ZnO; B2O3; Bi2O3; CuO; EPMA; MgO; PbO; SiO2; TGA; XRD; ZnO; glass frits; optical microscopy; oxidation behavior; oxidation enhancement; oxidation retardation; oxides; thermogravimetric analysis; thick film applications; thick film technology; Glass; Isothermal processes; Oxidation; Powders; Pressure control; Substrates; Temperature distribution; Thick films; Water heating; X-ray scattering;
  • fLanguage
    English
  • Journal_Title
    Components, Hybrids, and Manufacturing Technology, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0148-6411
  • Type

    jour

  • DOI
    10.1109/33.35489
  • Filename
    35489