DocumentCode
1235468
Title
An Improved Method for Measuring Quartz Crystal Parameters
Author
Williamson, Roger J.
Volume
34
Issue
6
fYear
1987
Firstpage
681
Lastpage
689
Keywords
Admittance measurement; Capacitance; Current measurement; Curve fitting; Electrical resistance measurement; Equivalent circuits; Frequency measurement; Optical wavelength conversion; Resonance; Voltage;
fLanguage
English
Journal_Title
Ultrasonics, Ferroelectrics, and Frequency Control, IEEE Transactions on
Publisher
ieee
ISSN
0885-3010
Type
jour
DOI
10.1109/T-UFFC.1987.27002
Filename
1539973
Link To Document