CONT: a concurrent test generation system

Author

Takamatsu, Yuzo ; Kinoshita, Kozo

Author_Institution

Dept. of Comput. Sci., Ehime Univ., Matsuyama, Japan

Volume

8

Issue

9

fYear

1989

fDate

9/1/1989 12:00:00 AM

Firstpage

966

Lastpage

972

Abstract

A test pattern generating system, CONT (CONcurrent Test generation) is discussed. The CONT system consists of two modes for test generation, TGM-C (CONT algorithm) and TGM-S. The TGM-C (test generation mode with concurrency) generates fault lists concurrently in order to speed up test generation. In the process of test generation with TGM-C, the primary input value is not changed but a target fault is switched to another one using the fault list when backtrack occurs. The TGM-S (test generation mode with a single target fault) generates a test pattern without changing a target fault. Experimental results show that the CON system is an efficient test generation system

Keywords

automatic testing; circuit analysis computing; combinatorial circuits; integrated circuit testing; logic testing; CONT; TGM-S; backtrack; combinational logic circuits; concurrency; concurrent test generation system; fault lists; logic IC testing; single target fault; test generation mode; Circuit faults; Circuit testing; Combinational circuits; Design for testability; Electrical fault detection; Fault detection; Large scale integration; System testing; Test pattern generators; Very large scale integration;

fLanguage

English

Journal_Title

Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on

Publisher

ieee

ISSN

0278-0070

Type

jour

DOI

10.1109/43.35548

Filename

35548