• DocumentCode
    1235947
  • Title

    Engineering aspects and applications of the new Raman instrumentation

  • Author

    Pitt, G.D. ; Batchelder, D.N. ; Bennett, R. ; Bormett, R.W. ; Hayward, I.P. ; Smith, B.J.E. ; Williams, K.P.J. ; Yang, Y.Y. ; Baldwin, K.J. ; Webster, S.

  • Author_Institution
    Renishaw plc, Wotton-Under-Edge, UK
  • Volume
    152
  • Issue
    6
  • fYear
    2005
  • Firstpage
    241
  • Lastpage
    318
  • Abstract
    Raman instrumentation design has improved radically in efficiency and ease of use over the past 15 years. New technologies made this possible with introduction of the first commercial high-efficiency (high speed) Raman systems incorporating low power lasers. Systems were introduced for the first time on production and process lines. Higher efficiency systems have continued to evolve, as a result of novel engineering solutions. Raman-near field optical systems and Raman-SEM (scanning electron microscopy) combinations have created a new area of nanoscale spectroscopic measurements. New application areas are: (a) semiconductor processing; (b) pharmaceutical drug processing; (c) gemology; (d) narcotic and explosives forensic detection; (e) coatings on computer hard disks and read heads; (f) endoscopic and Raman detection of oesophageal and other types of cancer. Comparisons are made with competing optical and alternative instrumentation techniques for general Raman work and the applications.
  • Keywords
    Raman spectroscopy; biomedical optical imaging; cancer; endoscopes; measurement by laser beam; pharmaceutical technology; reviews; scanning electron microscopy; semiconductor technology; Raman detection; Raman instrumentation; Raman microscope; Raman systems; Raman-SEM; Raman-near field optical systems; coatings; computer hard disks; endoscopic detection; explosives forensic detection; gemology; low power lasers; nanoscale spectroscopic measurements; narcotic forensic detection; oesophageal cancer; pharmaceutical drug processing; read heads; scanning electron microscopy; semiconductor processing;
  • fLanguage
    English
  • Journal_Title
    Science, Measurement and Technology, IEE Proceedings -
  • Publisher
    iet
  • ISSN
    1350-2344
  • Type

    jour

  • DOI
    10.1049/ip-smt:20050015
  • Filename
    1541352