Cross-type submicron Josephson junctions using SNS technology for Josephson voltage standard applications

Author

May, T. ; Schubert, M. ; Wende, G. ; Hübner, U. ; Fritzsch, L. ; Meyer, H.-G.

Author_Institution

Inst. for Phys. High Technol., Jena, Germany

Volume

13

Issue

2

fYear

2003

fDate

6/1/2003 12:00:00 AM

Firstpage

142

Lastpage

145

Abstract

We have developed a very simple method for manufacturing submicrometer Josephson junctions (JJs) based on niobium and titanium layers. Together with the use of a microwave circuit consisting of modified coplanar strips this type of JJs offers the possibility of easy integration of several thousand submicrometer junctions in a microwave circuit. Up to this point we have manufactured and successfully tested arrays with 2000 super-/normal-/super-conductor junctions with areas from 0.3 μm×0.3 μm to 2.0 μm×2.0 μm. First measurements with microwave irradiation showed stable Shapiro steps at voltages up to 40 mV and, thereby, the proper operation of all 2,000 junctions was seen.

Keywords

Josephson effect; measurement standards; niobium; superconducting arrays; superconducting microwave devices; superconductor-normal-superconductor devices; titanium; voltage measurement; Josephson voltage standard; Nb-Ti; SNS technology; Shapiro step; coplanar strip; cross-type submicron Josephson junction array; fabrication technology; microwave circuit; microwave irradiation; Circuit testing; Conductors; Josephson junctions; Manufacturing; Microwave circuits; Niobium; Shape; Superconducting devices; Superconducting transmission lines; Voltage;

fLanguage

English

Journal_Title

Applied Superconductivity, IEEE Transactions on

Publisher

ieee

ISSN

1051-8223

Type

jour

DOI

10.1109/TASC.2003.813666

Filename

1211562