• DocumentCode
    1236216
  • Title

    Nb/Al/Nb junctions with a wide range of characteristic voltages for superconducting electronic applications

  • Author

    Lacquaniti, Vincenzo ; Maggi, Sabino ; Steni, Raffaella ; Cagliero, Chiara ; Andreone, Domenico ; Rocci, Roberto

  • Author_Institution
    Inst. Elettrotecnico Nazionale "Galileo Ferraris", Turin, Italy
  • Volume
    13
  • Issue
    2
  • fYear
    2003
  • fDate
    6/1/2003 12:00:00 AM
  • Firstpage
    146
  • Lastpage
    149
  • Abstract
    Josephson devices for superconducting electronic applications, such as RSFQ logic circuits and programmable voltage standards, require nonhysteretic junctions with a high speed or a high voltage resolution and hence with characteristic voltages spanning over several orders of magnitude. We present here our recent results on Nb/Al/Nb junctions where, by changing some fabrication parameters such as the thickness and deposition rate of the Al barrier, it is possible to obtain junctions with very different electrical properties. These junctions have characteristic voltages varying from a few tens of μV up to more than 1 mV, with critical current densities from 103 up to 106 A/cm2.
  • Keywords
    Josephson effect; aluminium; critical current density (superconductivity); niobium; superconductor-normal-superconductor devices; Josephson device; Nb-Al-Nb; Nb/Al/Nb junction; RSFQ logic circuit; SNS technology; characteristic voltage; critical current density; electrical properties; fabrication process; nonhysteretic junction; programmable voltage standard; superconducting electronics; Critical current density; Electrodes; Fabrication; Josephson junctions; Niobium; Superconducting devices; Superconducting epitaxial layers; Superconducting films; Superconducting logic circuits; Voltage;
  • fLanguage
    English
  • Journal_Title
    Applied Superconductivity, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1051-8223
  • Type

    jour

  • DOI
    10.1109/TASC.2003.813667
  • Filename
    1211563