Title :
Defect detection in thick aircraft samples based on HTS SQUID-magnetometry and pattern recognition
Author :
Allweins, K. ; Gierelt, G. ; Krause, H.-J. ; Kreutzbruck, M.V.
Author_Institution :
Inst. of Appl. Phys., Justus-Liebig-Univ. Giessen, Germany
fDate :
6/1/2003 12:00:00 AM
Abstract :
SQUID technology has recently evolved to the point that it can be used for industrial applications in Non-Destructive Evaluation (NDE). We present the implementation of an HTS SQUID magnetometer in an eddy current testing system to measure very thick structures in large aircraft. We measured a 62 mm-thick, bolted aluminum sample from the EADS-Airbus, similar to the three-layered outer wing splice that is being proposed for the Airbus A-380. The combination of field sensitivities of a few pT/√Hz and a large dynamic range of about 140 dB/√Hz enabled us to detect defects at a depth of up to 40 mm. However a problem was presented by the fact that deep-lying defects which caused small field variations were superimposed on field changes, in their turn caused by current distortions in the vicinity of the titanium bolts. Separation of these two contributions was achieved through parameter optimization based on FEM simulations and signal processing. We report on the possibilities for flaw detection using adapted eddy current excitation.
Keywords :
SQUID magnetometers; aircraft testing; automatic test equipment; eddy current testing; finite element analysis; flaw detection; high-temperature superconductors; pattern recognition; 40 mm; 62 mm; Airbus A-380; FEM simulations; HTS SQUID magnetometer; deep-lying defects; defect detection; eddy current excitation; eddy current testing system; field sensitivities; flaw detection; industrial applications; large dynamic range; parameter optimization; pattern recognition; signal processing; thick aircraft samples; three-layered outer wing splice; Aircraft; Aluminum; Current measurement; Dynamic range; Eddy current testing; High temperature superconductors; Magnetic field measurement; Pattern recognition; SQUID magnetometers; Thickness measurement;
Journal_Title :
Applied Superconductivity, IEEE Transactions on
DOI :
10.1109/TASC.2003.813696