Title :
A Fail-Safe Logic System Utilizing Core Transistor Logic Elements
Author :
Nara, Akinao ; Fukinuki, Takahiko
Author_Institution :
Hitachi, Ltd., Tokyo, Japan.
Abstract :
The concept of ``fail-safe´´ is different from that of``failure minimization.´´ It assumes a specific responsibility in a logic system by being required to guarantee the safety of human lives—for instance, in a railway traffic control system.
Keywords :
Contacts; Costs; Electromagnetic forces; Humans; Logic circuits; Logic testing; Magnetic cores; Rail transportation; Railway safety; Relays;
Journal_Title :
Industrial Electronics and Control Instrumentation, IEEE Transactions on
DOI :
10.1109/TIECI.1971.231106