Title :
Propagation constant determination in microwave fixture de-embedding procedure
Author :
Mondal, Jyoti P. ; Chen, Tzu-Hung
Author_Institution :
Gen. Electr. Co., Syracuse, NY, USA
fDate :
4/1/1988 12:00:00 AM
Abstract :
An improper choice of dimensions for the standards used in the microwave de-embedding procedure will cause errors in the determination of the propagation constant. This leads to unrealistic values for the attenuation constant, which in turn causes errors in the de-embedded results. Proper selection of dimensions is made to minimize such errors. Physically realistic values are obtained with this selection
Keywords :
S-parameters; measurement errors; measurement standards; measurement theory; microwave measurement; semiconductor device testing; S-parameter measurement; attenuation constant; errors; microwave deembedding procedure; microwave fixture de-embedding; propagation constant; semiconductor device testing; standards; Attenuation; Fixtures; Impedance; Laboratories; Measurement standards; Microstrip; Microwave devices; Propagation constant; Scattering parameters; Testing;
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
