DocumentCode :
1236630
Title :
Phase noise of an HTS resonator operated in the nonlinear regime
Author :
Vitusevich, Svetlana A. ; Klein, Norbert ; Zaitsev, Alexander G. ; Geerk, Jochen
Author_Institution :
Inst. fur Schicht- und Grenzflachen, Forschungszentrum Julich GmbH, Germany
Volume :
13
Issue :
2
fYear :
2003
fDate :
6/1/2003 12:00:00 AM
Firstpage :
324
Lastpage :
327
Abstract :
Nonlinear properties of high-temperature superconducting (HTS) strongly coupled resonators at different input power have been investigated by measurements of the quality factor as a function of input power as well as by generation of the intermodulation distortion (IMD). The double-sided YBCO films on CeO2 buffered sapphire demonstrate advanced performance with the microwave surface resistance of ∼0.3 mΩ at 8.5 GHz at 77 K and an IMD third-order interception point estimated at Pcirc≈70 W. A parallel feedback oscillator was assembled using a transmission type HTS resonator cooled with liquid nitrogen and a room temperature low noise amplifier. Results on the phase noise investigation of the 2.3 GHz oscillator based on HTS resonator operated in the nonlinear regime demonstrated a deviation from the simple model of the phase noise, which predicts an up-conversion of 1/f noise of the amplifier to oscillator phase noise. The latter can be explained by the phase noise introduced additionally due to the nonlinear response of the HTS resonator.
Keywords :
1/f noise; Q-factor; barium compounds; high-temperature superconductors; intermodulation distortion; phase noise; superconducting device noise; superconducting resonators; surface resistance; yttrium compounds; 0.3 mohm; 1/f noise; 2.3 GHz; 70 W; 77 K; 8.5 GHz; HTS resonator; YBCO films; YBaCuO; high-temperature superconducting resonators; input power; intermodulation distortion; microwave surface resistance; nonlinear regime; parallel feedback oscillator; phase noise; quality factor; third-order interception point; transmission type resonator; up-conversion; Couplings; Distortion measurement; Electrical resistance measurement; High temperature superconductors; Oscillators; Phase noise; Superconducting device noise; Superconducting films; Superconducting microwave devices; Surface resistance;
fLanguage :
English
Journal_Title :
Applied Superconductivity, IEEE Transactions on
Publisher :
ieee
ISSN :
1051-8223
Type :
jour
DOI :
10.1109/TASC.2003.813720
Filename :
1211607
Link To Document :
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