DocumentCode :
1236891
Title :
Design and component test of a tiny processor based on the SFQ technology
Author :
Yoshikawa, N. ; Matsuzaki, F. ; Nakajima, N. ; Fujiwara, K. ; Yoda, K. ; Kawasaki, K.
Author_Institution :
Dept. of Electr. & Comput. Eng., Yokohama Nat. Univ., Japan
Volume :
13
Issue :
2
fYear :
2003
fDate :
6/1/2003 12:00:00 AM
Firstpage :
441
Lastpage :
445
Abstract :
An eight-bit SFQ processor has been designed and some key components have been tested to confirm feasibility of the large-scale SFQ digital circuit. The designed processor is composed of a one-bit ALU, two eight-bit registers with local clock generators, an instruction register, a five-bit program counter, a state controller, and a 32-byte register file. A bit-serial architecture and a distributed local clock architecture, where each register has its own local clock generator, have been employed in order to increase the local clock frequency. The target clock frequency is 16 GHz and 10 GHz for the NEC 2.5 kA/cm2 and Hypres 1 kA/cm2 Nb processes. On the circuit design level, we have used a data-driven self-timed architecture and a binary decision diagram, which reduce the timing design difficulty in high frequency operation. The processor, which contains 7,300 Josephson junctions, has been designed by using a cell-based design methodology with the assistance of a top-down CAD environment. We have successfully tested some important circuit blocks, including a one-bit ALU, eight-bit registers, and a demultiplexer for register files.
Keywords :
binary decision diagrams; circuit CAD; high-speed integrated circuits; integrated circuit design; integrated circuit testing; microprocessor chips; superconducting device testing; superconducting processor circuits; timing; 10 GHz; 16 GHz; ALU; BDD; Josephson junctions; SFQ microprocessor; SFQ processor; TIPPY3; binary decision diagram; bit-serial architecture; cell-based design methodology; data-driven self-timed architecture; distributed local clock architecture; high frequency operation; instruction register; large-scale SFQ digital circuit; local clock generators; processor components testing; program counter; registers; state controller; timing design; top-down CAD environment; Circuit testing; Clocks; Counting circuits; Digital circuits; Frequency; Large-scale systems; National electric code; Niobium; Process design; Registers;
fLanguage :
English
Journal_Title :
Applied Superconductivity, IEEE Transactions on
Publisher :
ieee
ISSN :
1051-8223
Type :
jour
DOI :
10.1109/TASC.2003.813892
Filename :
1211636
Link To Document :
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