DocumentCode :
1237033
Title :
The effects of DC bias current in large-scale SFQ circuits
Author :
Terai, Hirotaka ; Kameda, Yoshio ; Yorozu, Shinichi ; Fujimaki, Akira ; Wang, Zhen
Author_Institution :
Kansai Adv. Res. Center, Commun. Res. Lab., Kobe, Japan
Volume :
13
Issue :
2
fYear :
2003
fDate :
6/1/2003 12:00:00 AM
Firstpage :
502
Lastpage :
506
Abstract :
The supply of bias current is one of the key problems to be overcome for fully operational large-scale SFQ circuits. Large currents cause various undesirable effects that degrade circuit operation. The magnetic field induced by a large DC bias current affects the operation of several SFQ cells, even with a microstrip-line structure applied for the bias lines. In this paper, experimental results using SQUIDs show that bias-line shielding is the most effective way to reduce the effect of the DC bias current. The operating margins of SFQ cells were also found to be sensitive to the current in the ground plane. The location of a ground bonding should be close to the point of current injection if we wish to avoid undesirable diffusion of current through the ground plane. We confirmed the effectiveness of bias-line shielding and of the location of ground bonding with a circuit composed of about 500 junctions.
Keywords :
SQUIDs; cellular arrays; microstrip lines; shielding; superconducting logic circuits; DC bias current; SQUIDs; bias-line shielding; circuit operation; current injection; de bias current; ground bonding; large-scale SFQ circuits; microstrip-line structure; operating margins; Circuit simulation; Circuit synthesis; Current supplies; Degradation; Design methodology; Digital systems; Integrated circuit technology; Large-scale systems; National electric code; Software libraries;
fLanguage :
English
Journal_Title :
Applied Superconductivity, IEEE Transactions on
Publisher :
ieee
ISSN :
1051-8223
Type :
jour
DOI :
10.1109/TASC.2003.813917
Filename :
1211650
Link To Document :
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