DocumentCode
1237033
Title
The effects of DC bias current in large-scale SFQ circuits
Author
Terai, Hirotaka ; Kameda, Yoshio ; Yorozu, Shinichi ; Fujimaki, Akira ; Wang, Zhen
Author_Institution
Kansai Adv. Res. Center, Commun. Res. Lab., Kobe, Japan
Volume
13
Issue
2
fYear
2003
fDate
6/1/2003 12:00:00 AM
Firstpage
502
Lastpage
506
Abstract
The supply of bias current is one of the key problems to be overcome for fully operational large-scale SFQ circuits. Large currents cause various undesirable effects that degrade circuit operation. The magnetic field induced by a large DC bias current affects the operation of several SFQ cells, even with a microstrip-line structure applied for the bias lines. In this paper, experimental results using SQUIDs show that bias-line shielding is the most effective way to reduce the effect of the DC bias current. The operating margins of SFQ cells were also found to be sensitive to the current in the ground plane. The location of a ground bonding should be close to the point of current injection if we wish to avoid undesirable diffusion of current through the ground plane. We confirmed the effectiveness of bias-line shielding and of the location of ground bonding with a circuit composed of about 500 junctions.
Keywords
SQUIDs; cellular arrays; microstrip lines; shielding; superconducting logic circuits; DC bias current; SQUIDs; bias-line shielding; circuit operation; current injection; de bias current; ground bonding; large-scale SFQ circuits; microstrip-line structure; operating margins; Circuit simulation; Circuit synthesis; Current supplies; Degradation; Design methodology; Digital systems; Integrated circuit technology; Large-scale systems; National electric code; Software libraries;
fLanguage
English
Journal_Title
Applied Superconductivity, IEEE Transactions on
Publisher
ieee
ISSN
1051-8223
Type
jour
DOI
10.1109/TASC.2003.813917
Filename
1211650
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