Title :
Playing the ".ac" card in noise analysis of RSFQ circuits
Author :
Herr, Quentin P. ; Johnson, Mark W.
Author_Institution :
Space & Electron., TRW Inc., Redondo Beach, CA, USA
fDate :
6/1/2003 12:00:00 AM
Abstract :
Noise-induced bit error rate (BER) is an important design constraint for RSFQ circuits. No method, however, has been reported to calculate the BER of real, multi-junction RSFQ gates. We report such a method that requires only the operating margins and the root-mean-square noise current of the device in question. Noise current is determined using the ".ac" analysis card built into SPICE circuit simulators. As usual, operating margins are also determined using SPICE. These quantities determine BER via the error function, as is appropriate for threshold dynamics. The method is general enough to be applied to any RSFQ gate and even exotic circuits such as those that use passive microstrip signal propagation. Comparison to experimental data indicates that BER in RSFQ circuits does indeed arise strictly from thermal noise.
Keywords :
SPICE; circuit analysis computing; error statistics; integrated circuit noise; logic gates; superconducting device noise; superconducting logic circuits; thermal noise; Josephson ICs; RSFQ circuits; SPICE circuit simulators; ac analysis card; bit error rate; error function; multi-junction RSFQ gates; noise analysis; noise-induced BER; operating margins; passive microstrip signal propagation; root-mean-square noise current; thermal noise; threshold dynamics; Bit error rate; Circuit analysis; Circuit noise; Circuit simulation; Clocks; Josephson junctions; Microstrip; SPICE; Superconducting device noise; Testing;
Journal_Title :
Applied Superconductivity, IEEE Transactions on
DOI :
10.1109/TASC.2003.813926