• DocumentCode
    1237143
  • Title

    Design and component test of SFQ shift register memories

  • Author

    Fujiwara, K. ; Hoshina, H. ; Yamashiro, Y. ; Yoshikawa, N.

  • Author_Institution
    Dept. of Electr., Yokohama Nat. Univ., Japan
  • Volume
    13
  • Issue
    2
  • fYear
    2003
  • fDate
    6/1/2003 12:00:00 AM
  • Firstpage
    555
  • Lastpage
    558
  • Abstract
    The lack of a high-density and high-speed memory is a serious impediment for realization of large-scale RSFQ digital systems. A shift resister memory, which has high throughput and simple circuit structure, is one candidate to overcome this drawback. We show a design framework of the shift register memory, which is usable for the high-speed register files and the main memories of the RSFQ microprocessor. The proposed system consists of an array of shift registers and a packet decoder that switches a high-speed serial data stream into the specified shift register. The target clock frequency is 16 GHz assuming 2.5 kA/cm2 Nb standard process. We have estimated the propagation delay and the circuit area of the data-driven self-timed (DDST) packet decoder. Based on this estimation, we have also evaluated the access time and the area of the memory system. Several key components, including the one-to-two packet switch and the one-to-four DDST packet decoder, were implemented and their correct operations were confirmed.
  • Keywords
    decoding; high-speed integrated circuits; integrated circuit design; integrated circuit testing; logic testing; niobium; shift registers; superconducting device testing; superconducting memory circuits; 16 GHz; Nb standard process; RSFQ digital systems; RSFQ microprocessor; SFQ shift register memories; access time; component test; data-driven self-timed decoder; design framework; high throughput; high-speed memory; high-speed register files; high-speed serial data stream; main memories; memory system area; packet decoder; propagation delay; Circuit testing; Decoding; Digital systems; Impedance; Large-scale systems; Microprocessors; Packet switching; Shift registers; Switches; Throughput;
  • fLanguage
    English
  • Journal_Title
    Applied Superconductivity, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1051-8223
  • Type

    jour

  • DOI
    10.1109/TASC.2003.813945
  • Filename
    1211663