Title :
Noise analysis of gamma-ray TES microcalorimeters with a demonstrated energy resolution of 52 eV at 60 keV
Author :
Miyazaki, Toshiyuki ; Ullom, Joel N. ; Cunningham, Mark F. ; Labov, Simon E.
Author_Institution :
Lawrence Livermore Nat. Lab., CA, USA
fDate :
6/1/2003 12:00:00 AM
Abstract :
We present recent results from our γ-ray transition-edge sensor (TES) microcalorimeters. We have demonstrated an energy resolution of 52 eV at 60 keV with devices composed of a high-purity Sn absorber and a Mo/Cu multilayer thin-film TES. In this paper, we present a detailed noise analysis of these devices and show that the major noise sources are device originated (thermal fluctuation and Johnson noise). Our performance analysis explicitly includes the noise contribution due to the composite geometry of these devices and electro-thermal feedback (ETF).
Keywords :
gamma-ray detection; particle calorimetry; superconducting device noise; superconducting particle detectors; thermal noise; 60 keV; Johnson noise; Mo-Cu; Mo/Cu multilayer thin film; Sn; Sn absorber; electrothermal feedback; energy resolution; gamma-ray transition-edge sensor microcalorimeter; noise analysis; thermal fluctuations; Electrons; Energy resolution; Feedback; Inductance; Laboratories; Performance analysis; Phonons; SQUIDs; Temperature; Thermal conductivity;
Journal_Title :
Applied Superconductivity, IEEE Transactions on
DOI :
10.1109/TASC.2003.813975
