DocumentCode :
1237557
Title :
Determination of overwrite specification in thin-film head/disk systems
Author :
Bhattacharyya, Manoj K. ; Gill, H.S. ; Simmons, Ralph F., Jr.
Author_Institution :
Hewlett-Packard Co., Palo Alto, CA, USA
Volume :
25
Issue :
6
fYear :
1989
fDate :
11/1/1989 12:00:00 AM
Firstpage :
4479
Lastpage :
4489
Abstract :
A self-consistent write analysis using the Preisach model is presented and used to calculate overwrite in thin-film head/disk systems. Two overwrite characterization procedures are discussed, and for each of the procedures the calculated values are compared with measurements. Through a correlation of overwrite, nonlinear peak shifts, and readback output voltage the authors determine the overwrite requirement. They show that whereas -30 dB of overwrite will ensure a satisfactory overall performance of the recording system, a much lower overwrite, say -20 dB, can work in certain situations. An analytical implementation of the self-consistent model is presented and verified with measurements. The analytical approach can be used to determine the overwrite at any applied field for any head/disk combination. The authors introduce a normalized effective field hn, which depends on Mrδ, Hc, and other head/disk parameters. It is shown that a value of h n greater than 0.8 is needed for overwrite values of better than 25 dB. The importance of various head/disk parameters in optimizing the overwrite is also discussed
Keywords :
magnetic disc storage; magnetic heads; magnetic recording; magnetic thin film devices; Preisach model; analytical approach; nonlinear peak shifts; normalized effective field; overwrite characterization procedures; readback output voltage; recording system; self-consistent model; self-consistent write analysis; thin-film head/disk systems; Magnetic analysis; Magnetic anisotropy; Magnetic heads; Magnetic hysteresis; Magnetic materials; Magnetostatics; Micromagnetics; Perpendicular magnetic anisotropy; Transistors; Voltage;
fLanguage :
English
Journal_Title :
Magnetics, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9464
Type :
jour
DOI :
10.1109/20.45329
Filename :
45329
Link To Document :
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